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Zakład Fizyki
Magnetyków |
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Description of equipment of Laboratory
Femtosecond magneto-optical set-up
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Our results of light modification of magnetic films Our results in non-linear magnetooptics |
Description
Pulse laser
(SpectraPhysics MaiTai HP: 690-1040 nm, 80MHz, 80fs, 3W)
Optical Parametric Oscillator (SpectraPhysics Opal BB:
1100-1600 nm, 150fs, 0.7W, idler 1600-2250 nm, 0.2W)
Research:
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Magneto-optical spectroscopy
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Magnetization induced SHG
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Static and dynamics of domain structure
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Magnetic anisotropy and phase transition
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Light-induced magnetic effects
Materials:
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Ultrathin metalic films
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Nanopatterned structures
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YIG:Co exchange-coupled structured
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Light-sensitivity semicondutors
Contact
person: Dr Andrzej
Stupakiewicz, E-mail: and@uwb.edu.pl
Keywords: femtosecond laser, ultra-fast dynamics, second harmonics
generation, magneto-optical Kerr effect
Scanning Probe
Microscope Solver HV+ Ntegra Prima NT-MDT
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Opening
SPM Laboratory / Otwarcie Laboratorium SPM |
Short description
Scanning Probe
Microscope equipped with electro-magnets system, cold finger system and vacuum
chamber for the study of surface topography as well as magnetic, electrical and
electrochemical properties.
Full description
Scanning Probe
Microscope equipped with electro-magnets system (in-plane magnetic field up to
0.2T and perpendicular field up to 0.1T), cold finger system (110K-450K),
vacuum chamber (10-6 Torr), vibration isolation system and videomicroscope with
manual continuous zoom. Study of surface topography as well as magnetic,
electrical and electrochemical properties. Force and voltage lithography.
Measurements in high vacuum and in air (contact AFM, LFM, Resonant Mode
(semicontact + noncontact AFM), Phase Imaging, Force Modulation
(viscoelastisity), MFM, EFM, Adhesion Force Imaging, AFM Litography-Force,
Spreading Resistance Imaging ("conductive" AFM), AFM
Litography-Voltage, Scanning Capacitance Imaging, Scanning Kelvin Microscopy)
as well as in liquid (contact AFM, LFM, Adhesion Force, Force Modulation
(viscoelastisity), Resonant Mode(semicontact AFM), Phase Imaging, AFM
Litography-Force).
Contact
person: Dr hab.
Marek Kisielewski, E-mail: kisiel@uwb.edu.pl
Keywords: scanning probe microscopy, atomic force microscopy, magnetic
force microscopy
High Sensitivity
Magneto-Optical Kerr Magnetometer
Short description
High
Sensitivity Magneto-Optical Kerr Magnetometer equipped with special
electro-magnets system, diode, Ar and dye lasers, optical cryostats (with
liquid nitrogen and displex system enabling measurements from 10K), photo-elastic
modulator for magnetization reversal processes and vector magnetization
analysis in ultrathin multilayer magnetic films with specialized LabView
software for control and data analysis.
Full description
High
Sensitivity Magneto-Optical Kerr Magnetometer equipped with special
electro-magnets system (perpendicular to the plane sample up to 20kOe and
in-plane up to 4kOe magnetic field), Coherent Ar (Innova 300), dye (599-2) and
red-diode lasers, optical cryostat (10-350K), photo-elastic modulator (s,p-polarization,
rotation and ellipticity polar, longitudinal, transverse Kerr effects, linear
and circular dichroism). Study of static and dynamics magnetization reversal
processes and vector magnetization analysis in ultrathin multilayer magnetic
films with specialized LabView software for control magnetometer and data
analysis.
Contact
person: Dr. Andrzej
Stupakiewicz, E-mail: and@uwb.edu.pl
Keywords: magneto-optical Kerr effect, magnetization reversal processes,
photomagnetic effects, magneto-optical spectroscopy, linear and circular
dichroism
Magnetometers based on
optical polarizing microscopes
Short description
There are
optical polarizing microscopes (Carl Zeiss and one build from optical parts)
used for magnetization spatial distribution analysis based on polar and
longitudinal Kerr effects. Systems are sensitive for big2 and in film plane
magnetization components. These systems are equipped with special
electro-magnets system, Xe and halogen lamps, high sensitivity digital CCD
camera for static and dynamics domain structure images in nanostructure
multilayer magnetic films with specialized image processing techniques.
Full description
Carl Zeiss
Jenapol optical polarizing Kerr microscope equipped with special
electro-magnets system (static and pulses perpendicular and in-plane sample up
to 1kOe magnetic field), Carl Zeiss Xe and halogen lamps, high sensitivity
12-bit MicroMax CCD camera. Study of static and dynamics domain structure
images from milli- to submicro-size with both perpendicular and in-plane
magnetization components in nanostructure multilayer magnetic films with
specialized image processing techniques and LabView software for control and
data analysis.
Contact
person: Dr. Maria
Tekielak, E-mail: tekmar@uwb.edu.pl
Keywords: magneto-optical Kerr effect, magnetic domain structure, static
and dynamics magnetic domain wall
Magneto-Optical MagnetoAnisometer
Short description
Magneto-Optical
MagnetoAnisometer equipped with special electro-magnets system, red-diode laser
for magnetic anisotropy, magnetic after-effect and magnetization reversal
processes in thin and ultrathin magnetic films with specialized software for
control and data analysis.
Full description
Magneto-Optical
MagnetoAnisometer equipped with special electro-magnets system (perpendicular
to the plane sample up to 2kOe and in-plane up to 20kOe magnetic field),
red-diode laser, optical intensity modulator, polar Kerr and Faraday effects.
Study of magnetic anisotropy, magnetic after-effect, static and dynamics
magnetization reversal processes in thin and ultrathin magnetic films with
specialized software for control magnetometer and data analysis.
Contact
person: Dr hab.
Marek Kisielewski, E-mail: kisiel@uwb.edu.pl
Keywords: magneto-optical Kerr effect, Faraday effect, magnetic
anisotropy, magnetization reversal processes, magnetic after-effect
Ferromagnetic
resonance spectrometer.
Short description
A high -
sensitivity ferromagnetic resonance spectrometer at a microwave frequency of
9.5 GHz and at room temperatures with computerized data collection systems for
magnetic anisotropy analysis.
Full description
A high -
sensitivity ferromagnetic resonance spectrometer at a microwave frequency of
9.5 GHz and room temperatures with computerized data collection systems. The
FMR spectra are investigated as a function of the orientation of the applied dc
field. Study of magnetic anisotropy in thin and super thin magnetic samples.
Contact person: Dr. Ryszard Gieniusz, E-mail: gieniusz@uwb.edu..pl
Keywords: Ferromagnetic resonance, magnetic anisotropy, magnetic films.
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